Sales Support

Available time: M-F
8:00 am - 6:00 pm

Latest Video

Order Status

LCR | Resistance | Battery Testers

MAGNETIC FIELD HiTESTER FT3470-52

ee

• |Z|, L, C, R testing
• Testing source frequency: DC, or 4 Hz to 8 MHz
• Measuring time: 1 ms
• Accuracy guaranteed range from 1mΩ
• Continous testing under varying conditions

  IMPEDANCE ANALYZER IM7580

ff

• |Z|, L, C, R testing
• 1 MHz to 300 MHz testing source frequency
• Maximum test speed of 0.5 msec
• Measure LCR and conduct frequency sweeps simultaneously

 CHEMICAL IMPEDANCE ANALYZER IM3590

gg

• |Z|, L, C, R, σ, ε testing
• Battery measurement
• 1 mHz to 200 kHz
• 2 ms measurement time

LCR METER IM3533, IM3533-01

hh

• |Z|, L, C, R testing
• 1 mHz to 200 kHz
• 2 ms measurement time
• Transformer mode
• Frequency sweep w/IM3533-01

EQUIVALENT CIRCUIT ANALYSIS FIRMWARE IM9000

lcr1

Optional software for Model IM3570
• 5 equivalent circuit models
• Plot frequency characteristics graph from analysis results
• Cole-Cole plot, admittance circle display

 IMPEDANCE ANALYZER IM3570

lcr2

• |Z|, L, C, R testing
• 4 Hz to 5 MHz
• 0.5 ms measurement time
• Measure LCR and conduct frequency sweeps simultaneously

LCR HiTESTER 3535

lcr3

• |Z|, L, C, R testing
• 100kHz to 120MHz
• 6 ms measurement time

LCR HiTESTER 3532-50

lcr4

• |Z|, L, C, R testing
• 42Hz to 5MHz
• 5 ms measurement time

LCR and Capacitance Testing During Component Production

IMPEDANCE ANALYZER IM7580 new products

lcr5

• |Z|, L, C, R testing
• 1 MHz to 300 MHz testing source frequency
• Maximum test speed of 0.5 msec
• Measure LCR and conduct frequency sweeps simultaneously

C METER 3506

lcr7

• C, D (tan δ), Q, and low capacitance testing
• 1 kHz, 1 MHz
• 1.5 ms measurement time at 1 MHz